Report: There is a crack in everything. That’s how the light gets in

3rd European TA Conference, Cork, Ireland, May 17–19, 2017

Authors

  • Carmen Priefer Institute for Technology Assessment and Systems Analysis (ITAS), Karlsruhe Institute of Technology (KIT), (DE)
  • Linda Nierling Institute for Technology Assessment and Systems Analysis (ITAS), Karlsruhe Institute of Technology (KIT) (DE)
  • Constanze Scherz Institute for Technology Assessment and Systems Analysis (ITAS), Karlsruhe Institute of Technology (KIT) (DE)
  • Mahshid Sotoudeh Institute for Technology Assessment (ITA), Austrian Academy of Sciences (AT)
  • Lenka Hebáková Technology Centre of the CAS (TC) (CZ)

DOI:

https://doi.org/10.14512/tatup.26.3.76

Abstract

Report on the 3rd European TA Conference in Cork, Ireland on May 17th – 19th 2017.

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Published

20.12.2018

How to Cite

1.
Priefer C, Nierling L, Scherz C, Sotoudeh M, Hebáková L. Report: There is a crack in everything. That’s how the light gets in: 3rd European TA Conference, Cork, Ireland, May 17–19, 2017. TATuP [Internet]. 2018 Dec. 20 [cited 2021 Oct. 16];26(3):76-8. Available from: https://tatup.de/index.php/tatup/article/view/74

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